Ключевые слова: HTS, GdBCO, coated conductors, fabrication, RCE-CDR process, pinning, annealing process
Abd-Shukor R., Kechik M.M., Shaari A.H., Baqiah H., Talib Z.A., Kien C.S., Pah L.K., Dihom M.M., Yusuf N.N., Jusoh W.N., Sukor S.I.
Ключевые слова: HTS, YBCO, composition, oxygenation treatments, stability, phase diagram, fabrication, X-ray diffraction, microstructure, experimental results
Ключевые слова: HTS, GdBCO, phase diagram, stability, oxygenation treatments, films, PLD process, substrate LaAlO3, X-ray diffraction, microstructure, experimental results
Ключевые слова: HTS, coated conductors, fabrication, IBAD process, template layers, PLD process, buffer layers, films epitaxial, X-ray diffraction, microstructure
Ключевые слова: temperature dependence, pinning force, critical current density, angular dependence, microstructure, experimental results, HTS, GdBCO, nanodoping, nanoscaled effects, pinning, PLD process, substrate single crystal, critical caracteristics, resistive transition, composition, critical temperature, Jc/B curves
Ключевые слова: HTS, GdBCO, coated conductors, fabrication, annealing process, pinning, substrate Hastelloy, RCE-CDR process, X-ray diffraction, phase composition, fabrication, phase diagram, resistive transition, critical caracteristics, Jc/B curves, pinning force, critical current density, angular dependence, microstructure, experimental results
Xu X., Dou S.X., Yeoh W.K., Li W.X., Peleckis G., Ringer S.P., Zheng R.K., Wong D.C., Silva K.S., Bao P., Kondyurin A.
Xu X., Dou S.X., Yeoh W.K., Wang X.L., Li W.X., Ringer S.P., Liu H., Zheng R.K., De Silva K.S., Cui X.Y., Gault B., Yen H.-W., Wong D., Bao P., Larson D.J., Martin I.
Kursumovic A., Xu X., MacManus-Driscoll J.L., Dou S.X., Yeoh W.K., Chen S.K., Tan K.Y., De Silva K.S., Halim A.S.
Ключевые слова: MgB2, doping effect, mechanical properties, measurement technique, Raman spectroscopy, strain effects, bulk, substitution
Ключевые слова: HTS, REBCO, bulk, fabrication, seeding technique, trapped field distribution, single grain, critical caracteristics, critical temperature, Jc/B curves, size effect
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